4M Association

  • Home
  • About
  • Interest Groups
  • Projects
  • Join 4M
  • Bulletin
  • 4M Conference Series
  • Expert Workshop FOCUS

New optical metrology technique

Date 05-05-2010
Tags metrology / metrology-interest-group

Alicona Imaging GmbH have pioneered a new optical measurement technique that allows in-depth metrology of 3-D surfaces in the micro and nano range, and meets the ISO 25178 standard for topographical measurement. Full story on micromanufacturing.com.

6th congress on Micro and Nano Manufacturing

5th congress on Micro and Nano Manufacturing

4M/ICOMM2009 Conference

  • Scope
  • History
  • Programme Committee
  • Speakers
  • Important Deadlines
  • Registration and fees
  • License agreement
  • Provisional Programme
  • Submission Guidelines
  • Review Guidelines
  • Presentation Guidelines
  • Sponsors
  • Marketing Opportunities
  • Hotels and Acommodation
  • Travel Directions
  • Visiting Karlsruhe

4M2010 Conference

  • Scope
  • Important Deadlines (provisional)
  • License agreement
  • Submission Guidelines
  • 4M2010 Invited Speakers
  • Detail Programme
  • Overview Programme
  • Review Guidelines
  • Registration and fees
  • Presentation Guidelines
  • 1st Call for Papers
  • Hotels and Accommodation

4M2011 Conference

  • Call for Papers
  • Scope
  • History of the 4M Conference
  • Submission Guidelines
  • Overview Programme
  • Review Guidelines
  • Hotels & Accommodation
  • License Agreement
  • Organising Committee
  • Invited Speakers
  • Registration & fees
  • Sponsoring 4M2011
  • Our Sponsors

4M2012 Conference

  • 4M2012 Detailed Programme
  • Invited Speakers 4M2012
  • Submission Guidelines
  • History of the 4M Conference Series
  • Scope of 4M Conference
  • Sponsoring 4M2012
  • Registration & fees
  • Call for Papers 4M2012
  • License Agreement
  • Hotels & Accommodation
  • Organising Committee
  • Review Guidelines

4M2013 Conference

  • Invited Speakers 4M2013
  • Submission Guidelines
  • History of the 4M Conference Series
  • Scope of 4M Conference
  • Sponsoring 4M2013
  • Organising Committee
  • Review Guidelines
  • 4M2013 Detailed Programme
  • Hotels & Accommodation
  • Image Gallery
  • License Agreement
  • Presentations from the 4M 2013 Conference!
  • Venue Location and Directions
  • Registration & fees

4M/ICOMM2015 Conference

  • 4M2015 Detailed Programme
  • Call For Papers
  • Conference Registration
  • History of the 4M Conference Series
  • Hotel & Accommodation 2015
  • Invited Speakers 4M2015
  • License Agreement 2015
  • Organising Committee
  • Review Guidelines 2015
  • Scope of 4M Conference
  • Submission Guidelines
  • The Elena Ulieru Innovation Award
  • Travel funds for U.S. institutions' graduate students

4M/IWMF2016 Conference

  • Conference Programme
  • Social Programme & Gala Dinner
  • The Elena Ulieru Innovation Award
  • Conference Registration 4M2016
  • Invited Speakers 4M2016
  • Venue, Travel and Accommodation
  • Sponsoring 4M/IWMF 2016
  • Programme Committee
  • Call For Papers
  • License Agreement 2016
  • Submission Guidelines 2016

WCMNM2018

  • Congress Registration
  • Congress Programme
  • Call for Papers
  • Invited Speakers 2018
  • Scientific Committee
  • License Agreement 2018
  • The Social Programme & Gala Dinner
  • Venue, Travel and Accommodation
  • AITeM Photo Contest 2018
  • The Elena Ulieru Innovation Award
  • Sponsoring WCMNM 2018
  • Applied Sciences Micro/Nano Manufacturing Issue
  • 4 Page Paper Submission & Guidelines 2018

WCMNM 2019

  • Congress Registration

WCMNM2020

  • Call for papers
  • Venue

WCMNM2022

  • Congress Registration
    REGISTRATION IS NOW OPEN!
  • Paper submission and
    Copyright form
  • Call for Papers
  • Congress Programme
  • Keynote Speakers
  • Fees
  • Scientific Committee
  • Social Programme & Gala Dinner
  • Venue, Travel and Accommodation
  • Awards at the WCMNM2022
  • Sponsorship

Our Sponsors:

© 2023 4M Association. Developed by the Research Software Group at The University of Birmingham

Privacy | Legal | Freedom of Information | Cookies | Accessibility

Back to top