Alicona Imaging GmbH have pioneered a new optical measurement technique that allows in-depth metrology of 3-D surfaces in the micro and nano range, and meets the ISO 25178 standard for topographical measurement. Full story on micromanufacturing.com.

A call for potential metrology research topics on EMRP is open now to any entity or individual. The deadline for submissions is 28th March 2010.

More information can be found on the EMRP webpages.

Rapid and efficient industrial innovation requires not only leading scientific knowledge, but an understanding of latest technological advances and the harnessing of effective collaboration. Euspen provides an entrepreneurial network of leading industrialists and researchers working in the field of precision, micro and nano engineering through which these three key activities …

In partnership with CEMMNT, MM Live is pleased to announce the introduction of the Metrology in Micro Manufacturing Workshop, which will take place during the afternoon session of 21st October, of the Micro Manufacturing Conference.

Chairman's Introduction & Welcome
Paul Newbatt, CEMMNT

CEMMNT - A Measurement & Characterisation Service for the Micro Manufacturing …

There are several challenges that can arise when you start the process of measuring micro- and meso-scale parts. Some important factors to consider—before you begin measuring parts—are part handling, cleaning and fixturing.

See the full article on the Micro manufacturing website.

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The detailed chemical structure of a single molecule has been imaged for the first time, say researchers.

The physical shape of single carbon nanotubes has been outlined before, using similar techniques - but the new method even shows up chemical bonds. Read the full story on the BBC website.

Recent advances in modern manufacturing techniques has made it possible to manufacture small and complex components to extremely high accuracies. In direct response to the extreme demands of quality assurance for the measurement of size, form and position of microsystem parts, extensive research is being carried out in the area …

Working in conjunction with a major equipment manufacturer, Prof. Lars Mattsson, leader of the Metrology Division of the 4M Network of Excellence, reports that a new aspect ratio of 50:1 was recently achieved in laboratory measurements following the optimisation of an existing optical metrology system.

Prof. Mattsson, who is …

A revolutionary microscale measurement service based on patented standing wave technology is available from InsituTec, a Charlotte, NC-based precision metrology firm. The proprietary service provides true 3-D surface profilometry and surface finish measurement capability in one data set.

Achieving this level of precision can provide measurements on microfeatures, which represent …