Alicona Imaging GmbH have pioneered a new optical measurement technique that allows in-depth metrology of 3-D surfaces in the micro and nano range, and meets the ISO 25178 standard for topographical measurement. Full story on micromanufacturing.com.

A call for potential metrology research topics on EMRP is open now to any entity or individual. The deadline for submissions is 28th March 2010.

Recent advances in modern manufacturing techniques has made it possible to manufacture small and complex components to extremely high accuracies. In direct response to the extreme demands of quality assurance for the measurement of size, form and position of microsystem parts, extensive research is being carried out in the area of geometrical measurement on the micro-scale.